Abstract:
This paper analyzes the impact of terrestrial radiation effects on the reliability of a Smart Grid. The mechanisms of radiation effects on semiconductor devices are brief...Show MoreMetadata
Abstract:
This paper analyzes the impact of terrestrial radiation effects on the reliability of a Smart Grid. The mechanisms of radiation effects on semiconductor devices are briefly introduced and mitigation techniques are presented. Since this is a new research area, the future directions in it are discussed.
Published in: 2012 IEEE PES Innovative Smart Grid Technologies (ISGT)
Date of Conference: 16-20 January 2012
Date Added to IEEE Xplore: 03 April 2012
ISBN Information:
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