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A survey on ellipse detection methods | IEEE Conference Publication | IEEE Xplore

A survey on ellipse detection methods


Abstract:

Ellipses and elliptical features are evident in abundance, in a wide variety of digital images. Much of these features carry within itself useful statistical and geometri...Show More

Abstract:

Ellipses and elliptical features are evident in abundance, in a wide variety of digital images. Much of these features carry within itself useful statistical and geometrical information that can be exploited for a broad range of real-world applications. Algorithms developed of late for ellipse detection are application specific and are mainly based on traditional least-square fitting and Hough transform methods. This, in essence, is a step away from building a fully autonomous system with ellipse detection capabilities. This review attempts to redirect the research focus back towards a common goal of generating new ideas through the introduction of a modular framework.
Date of Conference: 28-31 May 2012
Date Added to IEEE Xplore: 12 July 2012
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Conference Location: Hangzhou, China

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