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Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs | IEEE Conference Publication | IEEE Xplore

Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs


Abstract:

SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature ins...Show More

Abstract:

SoCs used in safety-critical applications need to be dependable. However in the deep-submicron region, different kinds of aging effects like negative bias temperature instability (NBTI) make the SoCs, especially the analog/mixed-signal parts, undependable. In this paper, a dependability-improved Opamp is designed based on gain programmability and digital gain monitoring. To accomplish an extra gain range for tuning in 65nm technology, a new voltage-gain boosting method is proposed to provide a maximum 92dB gain in a single amplification stage. The NBTI influence is investigated using Cadence RelXpert and dependability properties for the Opamp are provided.
Date of Conference: 17-18 November 2011
Date Added to IEEE Xplore: 26 January 2012
ISBN Information:
Conference Location: Jeju, Korea (South)

References

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