Abstract:
Although high-speed memory testing using low-speed automatic test equipment (ATE) is possible using built-off selfrepair (BOST), there is a problem that the amount of out...Show MoreMetadata
Abstract:
Although high-speed memory testing using low-speed automatic test equipment (ATE) is possible using built-off selfrepair (BOST), there is a problem that the amount of output data is too large to transfer without stall through the slow ATE channel. To solve this problem, a new method called per-row output generator (PROG) is proposed in this paper. Using row fault buffering and reduced output data codes, PROG can efficiently reduce the output data regardless of the fault occurrence pattern in the memory. The additional transmission time required for this method is used within the time budget, and the hardware required for this method is not that large. In addition, the new output data code reduces the channel width between ATE and BOST.
Published in: 2022 19th International SoC Design Conference (ISOCC)
Date of Conference: 19-22 October 2022
Date Added to IEEE Xplore: 07 February 2023
ISBN Information:
Print on Demand(PoD) ISSN: 2163-9612