Abstract:
We present a compact design of a Single-Photon Avalanche Diode (SPAD) detector with a Passive Quenching Active Reset (PQAR) circuit for reducing the Dark Count Rate (DCR)...Show MoreMetadata
Abstract:
We present a compact design of a Single-Photon Avalanche Diode (SPAD) detector with a Passive Quenching Active Reset (PQAR) circuit for reducing the Dark Count Rate (DCR). Fabricated in 0.11μm CMOS Technology, the single pixel includes the SPAD device, quenching circuit, and a 10-bit counter. The integration of the PQAR circuit effectively suppresses the dark counts and improves the overall performance of the SPAD detector. By applying an excess bias of 2.5V, we achieved a DCR of 150cps.
Published in: 2023 20th International SoC Design Conference (ISOCC)
Date of Conference: 25-28 October 2023
Date Added to IEEE Xplore: 24 January 2024
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