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A Compact Design of SPAD Detector with Quenching Circuit for Reduced Dark Count Rate | IEEE Conference Publication | IEEE Xplore

A Compact Design of SPAD Detector with Quenching Circuit for Reduced Dark Count Rate


Abstract:

We present a compact design of a Single-Photon Avalanche Diode (SPAD) detector with a Passive Quenching Active Reset (PQAR) circuit for reducing the Dark Count Rate (DCR)...Show More

Abstract:

We present a compact design of a Single-Photon Avalanche Diode (SPAD) detector with a Passive Quenching Active Reset (PQAR) circuit for reducing the Dark Count Rate (DCR). Fabricated in 0.11μm CMOS Technology, the single pixel includes the SPAD device, quenching circuit, and a 10-bit counter. The integration of the PQAR circuit effectively suppresses the dark counts and improves the overall performance of the SPAD detector. By applying an excess bias of 2.5V, we achieved a DCR of 150cps.
Date of Conference: 25-28 October 2023
Date Added to IEEE Xplore: 24 January 2024
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Conference Location: Jeju, Korea, Republic of

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