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Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix | IEEE Conference Publication | IEEE Xplore

Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix


Abstract:

As CMOS technology is reaching the nanometer scale, transient and intermittent faults occurrence in logic circuits, which implies a reliability degradation, can no longer...Show More

Abstract:

As CMOS technology is reaching the nanometer scale, transient and intermittent faults occurrence in logic circuits, which implies a reliability degradation, can no longer be neglected. This paper deals with reliability evaluation which is a critical parameter in circuit design. The proposed method is scalable, iterative and accelerates the reliability analysis.
Date of Conference: 22-24 March 2010
Date Added to IEEE Xplore: 15 April 2010
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Conference Location: San Jose, CA, USA

References

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