Major Contributions on Uncertainty in Radar Image Based Near-field to Far-Field RCS Measurement | IEEE Conference Publication | IEEE Xplore

Major Contributions on Uncertainty in Radar Image Based Near-field to Far-Field RCS Measurement


Abstract:

Reliable Radar Cross Section (RCS) measurements require complex instrumentation systems, expensive and dedicated test ranges and operations, especially when dealing with ...Show More

Abstract:

Reliable Radar Cross Section (RCS) measurements require complex instrumentation systems, expensive and dedicated test ranges and operations, especially when dealing with full-scale targets. Thus performing RCS measurements using near field test ranges and non-ideally anechoic environments is a very attractive option. Applications related to these topics have recently been of increasing interest especially in the design-prototyping loop of low observable platforms and full-scale components. To this purpose, IDS has been developing and using reliable RCS measurement solutions and innovative processing techniques for more than fifteen years. This paper focuses on the major contributions to uncertainty in radar image based near field to far-field RCS measurement, by reviewing each of the principal sources of uncertainty, both random and systematic, and underlining possible error mitigation strategies.
Date of Conference: 08-10 July 2019
Date Added to IEEE Xplore: 19 August 2019
ISBN Information:

ISSN Information:

Conference Location: Catania, Italy

References

References is not available for this document.