A random intrinsic chip ID generation method using retention fails is implemented in 32 nm SOI embedded DRAM. A dynamic key algorithm employs a unique pair of 4 Kb binary strings for an ID record for secure authentication. These strings are generated by controlling a wordline low voltage to search for a number of fails matching the corresponding challenge numbers. The algorithm further includes field-tolerant authentication by detecting a number of common bits analytically guaranteed for successful recognition, while preventing ID spoofing during the read operation. This results in 100% successful unique ID generation and recognition in two temperature and three voltage conditions per chip for a total of $\sim$ 420 k ID pair comparisons in 266 chips. The analytical model predicts a 99.999% successful recognition rate for 10 $^{6}$ parts. Finally, a method to enable a field-tolerant ID using multiple domains will be discussed.