This paper describes the design and implementation of an 80-kb logic-embedded non-volatile multi-time programmable memory (MTPM) with no added process complexity. Charge trap transistors (CTTs) that exploit charge trapping and de-trapping behavior in high-K dielectric of 32-/22-nm Logic FETs are used as storage elements with logic-compatible programming voltages. A high-gain slew-sense amplifier (SA) is used to efficiently detect the threshold voltage difference ( $\Delta V_{\textrm {DIF}}$ ) between the true and complement FETs in the twin cell. Design-assist techniques including multi-step programming with over-write protection and block write algorithm are used to enhance the programming efficiency without causing a dielectric breakdown. High-temperature stress results show a projected data retention of 10 years at 125 °C with a signal loss of <30% that is margined in while programming, by employing a sense margining logic in the SA. Scalability of CTT has been established by the first demonstration of CTT-based MTPM in 14-nm bulk FinFET technology with read cycle time of 40 ns at 0.7-V VDD.