Abstract:
A redundancy eliminated flip-flop (REFF) is proposed targeting wide-range voltage scalability (1–0.3 V). Two types of redundancies are eliminated in the REFF to achieve l...Show MoreMetadata
Abstract:
A redundancy eliminated flip-flop (REFF) is proposed targeting wide-range voltage scalability (1–0.3 V). Two types of redundancies are eliminated in the REFF to achieve low-power (LP) and reliable operation even in the sub-threshold voltage regime. First, redundant internal clock transitions are eliminated without degrading reliability by finding the optimal way of generating internally inverted clock to reduce dynamic power consumption. Then redundant transistors are identified and eliminated with a topological and logical method while keeping it fully static and contention-free. The simulation results show that the REFF is currently the only FF that fully eliminates redundancy while maintaining static and contention-free operation, and is reliable down to 0.31 V in Monte-Carlo simulations. The measurement results from a test chip fabricated in 28-nm LP CMOS technology show that the measured power is reduced by 69.7%/58.7% with 0%/10% activity at 1 V and by 70.3%/58.2% with 0%/10% activity at 0.4 V compared to the conventional transmission gate flip-flop (TGFF). A total of 100 dies from five corners were tested to demonstrate the reliability, and the REFF was functional down to 0.28 V.
Published in: IEEE Journal of Solid-State Circuits ( Volume: 56, Issue: 10, October 2021)