Abstract:
Image simulation of remote sensing systems is important for the development of new instruments and validations of data processing algorithms. In image simulation process,...Show MoreMetadata
Abstract:
Image simulation of remote sensing systems is important for the development of new instruments and validations of data processing algorithms. In image simulation process, surface scene simulation is a fundamental issue and usually has the first priority. For two mid-infrared absorption bands near 2.7 μm and 4.3 μm, although there are a lot of applications in remote sensing field, relevant research on surface scene simulation is very limited. In these two mid-infrared ranges, surface radiance is a combination of reflected and emitted radiance. However, the radiance is generally reduced because of strong absorption by atmosphere. Therefore, analysis of surface reflected radiance is essential for simulation work. In this paper, we use a radiative transfer model MODTRAN to simulate proportions of surface reflected radiance for common ground materials under various observation conditions. The obtained results show that proportions of studied materials are 0.8%-99.8% in the band of 2.63-2.83 μm and 1.1%-94.8% in the band of 4.2-4.5 μm. The proportions of surface reflected radiance in both absorption bands are affected by surface reflectivity. In addition, in the band of 2.7 μm the proportion of surface reflected radiance is sensitive to solar geometry, water vapor content and surface temperature, whereas it is insensitive in the band of 4.3 μm. Based on these results, we conduct that both reflection and emission are important for surface scene simulations in the 2.7 μm and 4.3 μm absorption bands.
Published in: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing ( Volume: 7, Issue: 6, June 2014)