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Advanced coherence stacking technique using high resolution TerraSAR-X spotlight data | IEEE Conference Publication | IEEE Xplore

Advanced coherence stacking technique using high resolution TerraSAR-X spotlight data


Abstract:

Measuring the long-term LOS deformation using a multi-pass SAR data stack by standard persistent scatterer (PS) technique has been explored since the late 1990s. Research...Show More

Abstract:

Measuring the long-term LOS deformation using a multi-pass SAR data stack by standard persistent scatterer (PS) technique has been explored since the late 1990s. Researches have been continuously conducted on increasing the data coverage at non-PS-rich areas. The recently developed SqueeSAR™ technique has validated the potential of extracting useful information from distributed scatterers. With the availability of high resolution TerraSAR-X spotlight data, this technique can benefit greatly from its higher data density and quality. This paper presents an algorithm of optimal parameter estimation at distributed scatterers in a high resolution TerraSAR-X spotlight data, paying particular attention to the covariance matrix estimation. Studies are presented on adaptive sample selection strategy for covariance matrix estimation using different statistical tests (Anderson-Darling). In addition, an adaptive multi-resolution defringe algorithm is introduced to cope with the problem of accurate fringe removal and in turn accurate covariance matrix estimation.
Date of Conference: 11-13 April 2011
Date Added to IEEE Xplore: 05 May 2011
ISBN Information:
Print ISSN: 2334-0932
Conference Location: Munich, Germany

References

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