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Towards an approach using metric learning for interactive semi-supervised clustering of images | IEEE Conference Publication | IEEE Xplore

Towards an approach using metric learning for interactive semi-supervised clustering of images


Abstract:

The problem of unsupervised and semi-supervised clustering is extensively studied in machine learning. In order to involve user in image data clustering, we proposed in [...Show More

Abstract:

The problem of unsupervised and semi-supervised clustering is extensively studied in machine learning. In order to involve user in image data clustering, we proposed in [1] a new approach for interactive semi-supervised clustering that translates user feedback (expressed at the level of individual images) into pairwise constraints between groups of images, these groups being formed thanks to the underlying hierarchical clustering solution and user feedback. Recently, the need for appropriate measures of distance or similarity between data led to the emergence of distance metric learning approaches. In this paper1, we propose a method incorporating metric learning in the existing system to improve performance and reduce the computational time. Our preliminary experiments performed on the Wang dataset show that metric learning methods improve the performances and computational time of the existing system.
Date of Conference: 06-08 October 2016
Date Added to IEEE Xplore: 01 December 2016
ISBN Information:
Conference Location: Hanoi, Vietnam

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