Abstract:
This work presents the analysis of a 90 nm CMOS LNA under process variations. The main parameters charactering the performance of this kind of devices are analyzed. It sh...Show MoreMetadata
Abstract:
This work presents the analysis of a 90 nm CMOS LNA under process variations. The main parameters charactering the performance of this kind of devices are analyzed. It shows how the performance degradation is mainly derived from the resonant frequency shifting due to the output matching passive network. A way to partially compensate the degradation is presented. Preliminary results are shown.
Date of Conference: 27 February 2013 - 01 March 2013
Date Added to IEEE Xplore: 23 May 2013
ISBN Information:
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