gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations | IEEE Conference Publication | IEEE Xplore

gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations


Abstract:

Increasing chip power densities allied to the continuous technology shrink are making emerging multiprocessor embedded systems more vulnerable to radiation-induced transi...Show More
Notes: This article was mistakenly omitted from the original submission to IEEE Xplore. It is now included as part of the conference record.

Abstract:

Increasing chip power densities allied to the continuous technology shrink are making emerging multiprocessor embedded systems more vulnerable to radiation-induced transient faults (i.e., soft errors). Due the high cost and design time inherent to board-based fault injection approaches, more appropriate and efficient simulation-based fault injection frameworks become crucial to guarantee the adequate design exploration support at the early design phases. Virtual platforms emerge as a solution to early reliability explorations as it offers a flexible modeling environment, acceptable simulation speed, and different accuracy levels. This work introduces a fast and flexible fault injector framework (gem5-FIM) developed using a state-of-the-art cycle-accurate virtual platform (i.e., gem5 simulator), which accelerates the analysis of complex and large-scale systems composed of commercial processors under different classes of fault campaigns. Further, the gem5-FIM supports multicore ARM processor models running sophisticated software stacks comprising a Linux OS and parallelization libraries (e.g., MPI, OpenMP). Authors also propose different techniques to boost up the fault injection process.
Notes: This article was mistakenly omitted from the original submission to IEEE Xplore. It is now included as part of the conference record.
Date of Conference: 25-28 February 2018
Date Added to IEEE Xplore: 20 May 2019
ISBN Information:
Electronic ISSN: 2473-4667
Conference Location: Puerto Vallarta, Mexico

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References

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