Abstract:
In this work, a functional-based test method is presented that integrates the test of Network-on-Chip interconnects and routers. The proposed approach is scalable to any ...Show MoreMetadata
Abstract:
In this work, a functional-based test method is presented that integrates the test of Network-on-Chip interconnects and routers. The proposed approach is scalable to any size of network. Experimental results show that fault coverage can reach up to 100% of interconnect faults and 92.75% of router faults, with yet affordable test sequence lengths.
Published in: 2010 11th Latin American Test Workshop
Date of Conference: 28-31 March 2010
Date Added to IEEE Xplore: 19 August 2010
ISBN Information:
Print ISSN: 2373-0862
Contents 