Abstract:
Electronic systems functionality degrades when these systems are operating in harsh environments such as those where they are exposed to ionizing radiation. Understanding...Show MoreMetadata
Abstract:
Electronic systems functionality degrades when these systems are operating in harsh environments such as those where they are exposed to ionizing radiation. Understanding and measuring these effects is extremely important in order to design systems that can operate reliably. This work discusses experimental data of heavy ion and x-ray radiation effects on a Commercial-Off-The-Shelf (COTS) low-cost microprocessor. The heavy ions test results suggest that, in this technology, the SRAM is more sensitive to SEE than flash memory. Ions with a LET higher than 5 MeV/mg/cm2 may disrupt the device's proper operation.
Published in: 2017 18th IEEE Latin American Test Symposium (LATS)
Date of Conference: 13-15 March 2017
Date Added to IEEE Xplore: 24 April 2017
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