Abstract:
A free-space microwave method is proposed for accurate dielectric constant \varepsilon _{r} measurement of flat dielectric samples using time-domain measurements. It ...Show MoreMetadata
Abstract:
A free-space microwave method is proposed for accurate dielectric constant \varepsilon _{r} measurement of flat dielectric samples using time-domain measurements. It does not require any reference data (calibration-independent) and thickness information for \varepsilon _{r} measurement. Besides, it uses only two power peaks of reflected signals of one sample with offset metal termination. It is first validated by simulations and numerical analysis. Free-space \varepsilon _{r} measurements of three low-loss dielectric samples [polypropylene (PP), polyethylene (PE), and polyoxymethylene (POM)] are then performed for validation of our method. Its accuracy is compared with the accuracies of similar methods in the literature.
Published in: IEEE Geoscience and Remote Sensing Letters ( Volume: 20)