Beam Selection Based on Sequential Competition | IEEE Journals & Magazine | IEEE Xplore

Beam Selection Based on Sequential Competition


Abstract:

We present a novel M-ary sequential test for beam selection when knowledge about the SNR operating point is not available. The proposed sequential test adaptively changes...Show More

Abstract:

We present a novel M-ary sequential test for beam selection when knowledge about the SNR operating point is not available. The proposed sequential test adaptively changes the test length (the number of observations) according to the SNR operating point to achieve the desired performance. Moreover, to achieve the same performance in terms of captured signal power, the sequential competition test requires on average less observations (particularly in the lower SNR regime) in comparison to a perfectly tuned fixed length test assuming genie knowledge.
Published in: IEEE Signal Processing Letters ( Volume: 26, Issue: 3, March 2019)
Page(s): 455 - 459
Date of Publication: 24 January 2019

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