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Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets | IEEE Journals & Magazine | IEEE Xplore

Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets


Abstract:

This letter derives bounds on performance degradation due to measurement noise in millimeter wave beam alignment methods that train a subset of beam pairs. The analysis a...Show More

Abstract:

This letter derives bounds on performance degradation due to measurement noise in millimeter wave beam alignment methods that train a subset of beam pairs. The analysis applies the union bound and pairwise beam selection error for a wideband channel. While the analysis is oblivious to the method to select the subset of beam pairs, inverse fingerprinting beam alignment is used as a concrete numerical example. Performance evaluation results for different bandwidths show that a wideband system suffers less from measurement noise with the same training sequence duration.
Published in: IEEE Wireless Communications Letters ( Volume: 7, Issue: 5, October 2018)
Page(s): 784 - 787
Date of Publication: 10 April 2018

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