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A Fault Analysis Perspective for Testing of Secured SoC Cores | IEEE Journals & Magazine | IEEE Xplore

A Fault Analysis Perspective for Testing of Secured SoC Cores


Abstract:

Can the inputs of a cryptocore be stressed to leak the secret key? This article demonstrates such a vulnerability challenging secure integration of these cores in a syste...Show More

Abstract:

Can the inputs of a cryptocore be stressed to leak the secret key? This article demonstrates such a vulnerability challenging secure integration of these cores in a system-on-chip design.
Published in: IEEE Design & Test ( Volume: 30, Issue: 5, October 2013)
Page(s): 63 - 73
Date of Publication: 15 March 2013

ISSN Information:


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