Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits | IEEE Journals & Magazine | IEEE Xplore

Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits


Abstract:

There are various sources of single event transient (SET) errors for combinatorial logic circuits. This article discusses effects of various sources of SET errors and pre...Show More

Abstract:

There are various sources of single event transient (SET) errors for combinatorial logic circuits. This article discusses effects of various sources of SET errors and presents a comparative analysis in different technology nodes.
Published in: IEEE Design & Test ( Volume: 30, Issue: 6, December 2013)
Page(s): 89 - 97
Date of Publication: 06 May 2013

ISSN Information:


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