Abstract:
There are various sources of single event transient (SET) errors for combinatorial logic circuits. This article discusses effects of various sources of SET errors and pre...Show MoreMetadata
Abstract:
There are various sources of single event transient (SET) errors for combinatorial logic circuits. This article discusses effects of various sources of SET errors and presents a comparative analysis in different technology nodes.
Published in: IEEE Design & Test ( Volume: 30, Issue: 6, December 2013)