Loading [MathJax]/extensions/MathMenu.js
An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces | IEEE Journals & Magazine | IEEE Xplore

An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces


Abstract:

The capital cost of conventional RF ATE systems is very high. This article presents a low-cost ATE system that is capable of generating QAM test signals and detecting sym...Show More

Abstract:

The capital cost of conventional RF ATE systems is very high. This article presents a low-cost ATE system that is capable of generating QAM test signals and detecting symbol errors in received QAM signals.
Published in: IEEE Design & Test ( Volume: 33, Issue: 6, December 2016)
Page(s): 15 - 22
Date of Publication: 13 July 2016

ISSN Information:


Contact IEEE to Subscribe

References

References is not available for this document.