Abstract:
We start the new year where we left the previous one: on test. This is also a continuation of our intense focus on 3-D circuits after a couple of special issues on ...View moreMetadata
Abstract:
We start the
new year where we left the previous one: on test. This is also a continuation of our intense focus on 3-D circuits after a couple of special issues on that topic in 2016 showing the open challenges on testing 3-D designs. My thanks go to Guest Editors Erik Jan Marinissen and Yervant Zorian for bringing this important issue to the IEEE Design&Test magazine.
Published in: IEEE Design & Test ( Volume: 34, Issue: 1, February 2017)