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3D Test | IEEE Journals & Magazine | IEEE Xplore

Abstract:

We start the new year where we left the previous one: on test. This is also a continuation of our intense focus on 3-D circuits after a couple of special issues on ...View more

Abstract:

We start the new year where we left the previous one: on test. This is also a continuation of our intense focus on 3-D circuits after a couple of special issues on that topic in 2016 showing the open challenges on testing 3-D designs. My thanks go to Guest Editors Erik Jan Marinissen and Yervant Zorian for bringing this important issue to the IEEE Design&Test magazine.
Published in: IEEE Design & Test ( Volume: 34, Issue: 1, February 2017)
Page(s): 4 - 5
Date of Publication: 16 January 2017

ISSN Information:

Publisher: IEEE