Loading [a11y]/accessibility-menu.js
Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects | IEEE Journals & Magazine | IEEE Xplore
Subscribe
ADVANCED SEARCH
Journals & Magazines >IEEE Design & Test >Volume: 36 Issue: 1

Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects

PDF
L. Pizano-Escalante; O. Longoria-Gandara; R. Parra-Michel; F. Peña-Campos
All Authors

Abstract:

This work aims to predict bounds on bit-error-rate performance of highspeed interconnects. The novelty lies in the characterization of timing jitter to achieve more accur...Show More

Metadata

Abstract:

This work aims to predict bounds on bit-error-rate performance of highspeed interconnects. The novelty lies in the characterization of timing jitter to achieve more accurate modeling of such interconnects.
Published in: IEEE Design & Test ( Volume: 36, Issue: 1, February 2019)
Page(s): 31 - 39
Date of Publication: 14 August 2018

ISSN Information:

DOI: 10.1109/MDAT.2018.2865455
Contents
Contact IEEE to Subscribe

References

References is not available for this document.

IEEE Account

Purchase Details

Profile Information

Need Help?

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.