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Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors | IEEE Journals & Magazine | IEEE Xplore

Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors


Abstract:

Editor’s note: This article presents a novel framework that combines a QoS-aware memory partitioning scheme and a reinforcement-learning-based I/O voltage-swing tuning fo...Show More

Abstract:

Editor’s note: This article presents a novel framework that combines a QoS-aware memory partitioning scheme and a reinforcement-learning-based I/O voltage-swing tuning for energy-efficient and reliable processor-DRAM subsystem design. —Sudeep Pasricha, Colorado State University
Published in: IEEE Design & Test ( Volume: 38, Issue: 6, December 2021)
Page(s): 88 - 95
Date of Publication: 08 December 2020

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