Abstract:
This article argues that the integration of machine learning (ML) techniques with well-established algorithmic approaches can overcome challenges faced by current applica...Show MoreMetadata
Abstract:
This article argues that the integration of machine learning (ML) techniques with well-established algorithmic approaches can overcome challenges faced by current applications of ML to electronic design automation problems. The standard cell routing problem is used as a showcase for the proposed approach.
Published in: IEEE Design & Test ( Volume: 40, Issue: 1, February 2023)