Machine Learning and Algorithms: Let Us Team Up for EDA | IEEE Journals & Magazine | IEEE Xplore

Machine Learning and Algorithms: Let Us Team Up for EDA


Abstract:

This article argues that the integration of machine learning (ML) techniques with well-established algorithmic approaches can overcome challenges faced by current applica...Show More

Abstract:

This article argues that the integration of machine learning (ML) techniques with well-established algorithmic approaches can overcome challenges faced by current applications of ML to electronic design automation problems. The standard cell routing problem is used as a showcase for the proposed approach.
Published in: IEEE Design & Test ( Volume: 40, Issue: 1, February 2023)
Page(s): 70 - 76
Date of Publication: 14 January 2022

ISSN Information:


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