Abstract:
The articles in this issue are divided into three groups: 1) the first group belongs to a special issue (SI) covering selected articles from the 33rd Symposium on Integra...Show MoreMetadata
Abstract:
The articles in this issue are divided into three groups: 1) the first group belongs to a special issue (SI) covering selected articles from the 33rd Symposium on Integrated Circuits and Systems Design (SBCCI 2020); 2) SI on Near-Memory and In-Memory Processing; and 3) general interest articles.
Published in: IEEE Design & Test ( Volume: 39, Issue: 2, April 2022)