Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments | IEEE Journals & Magazine | IEEE Xplore

Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments


Abstract:

Editor’s notes: Tester inaccuracies can cause even good chips to fail manufacturing test. This article discusses a recycling test method in which failing chips are tested...Show More

Abstract:

Editor’s notes: Tester inaccuracies can cause even good chips to fail manufacturing test. This article discusses a recycling test method in which failing chips are tested again under appropriate conditions to reduce the yield loss while still maintaining acceptable test time. —Jennifer Dworak, Southern Methodist University
Published in: IEEE Design & Test ( Volume: 40, Issue: 3, June 2023)
Page(s): 45 - 52
Date of Publication: 10 November 2022

ISSN Information:


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