Abstract:
Editor’s notes: Tester inaccuracies can cause even good chips to fail manufacturing test. This article discusses a recycling test method in which failing chips are tested...Show MoreMetadata
Abstract:
Editor’s notes: Tester inaccuracies can cause even good chips to fail manufacturing test. This article discusses a recycling test method in which failing chips are tested again under appropriate conditions to reduce the yield loss while still maintaining acceptable test time. —Jennifer Dworak, Southern Methodist University
Published in: IEEE Design & Test ( Volume: 40, Issue: 3, June 2023)