Abstract:
Editor’s notes: This article introduces a novel debug unit enabling compositional postsilicon validation of heterogeneous SoCs. The unit’s effectiveness is demonstrated i...Show MoreMetadata
Abstract:
Editor’s notes: This article introduces a novel debug unit enabling compositional postsilicon validation of heterogeneous SoCs. The unit’s effectiveness is demonstrated in post-silicon validation by integrating it into a 12-nm complex SoC prototype. —Mahdi Nikdast, Colorado State University, USA —Miquel Moreto, Barcelona Supercomputing Center, Spain —Masoumeh (Azin) Ebrahimi, KTH Royal Institute of Technology, Sweden —Sujay Deb, IIIT Delhi, India
Published in: IEEE Design & Test ( Volume: 40, Issue: 6, December 2023)