Abstract:
Editor’s notes: Safety-critical applications, such as automotive electronics and data centers, demand high reliability. Integrating design-for-test (DFT) across silicon l...Show MoreMetadata
Abstract:
Editor’s notes: Safety-critical applications, such as automotive electronics and data centers, demand high reliability. Integrating design-for-test (DFT) across silicon lifecycle addresses challenges for in-system and in-field operations, which are reviewed in this article. — Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany
Published in: IEEE Design & Test ( Volume: 41, Issue: 4, August 2024)