The Future of Design for Test and Silicon Lifecycle Management | IEEE Journals & Magazine | IEEE Xplore

The Future of Design for Test and Silicon Lifecycle Management


Abstract:

Editor’s notes: Safety-critical applications, such as automotive electronics and data centers, demand high reliability. Integrating design-for-test (DFT) across silicon l...Show More

Abstract:

Editor’s notes: Safety-critical applications, such as automotive electronics and data centers, demand high reliability. Integrating design-for-test (DFT) across silicon lifecycle addresses challenges for in-system and in-field operations, which are reviewed in this article. — Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany
Published in: IEEE Design & Test ( Volume: 41, Issue: 4, August 2024)
Page(s): 35 - 49
Date of Publication: 20 November 2023

ISSN Information:


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