Abstract:
The focus of this issue is the special issue on the broad topic of silicon lifecycle management (SLM). Additionally, we have the interview with Janusz Rajski, who is th...Show MoreMetadata
Abstract:
The focus of this issue is the special issue on the broad topic of silicon lifecycle management (SLM). Additionally, we have the interview with Janusz Rajski, who is the vice president of engineering at Siemens Tessent Wilsonville, Wilsonville, OR, USA.
Published in: IEEE Design & Test ( Volume: 41, Issue: 4, August 2024)