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Journals & Magazines >IEEE Design & Test of Computers >Volume: 19 Issue: 3

Design for debug: catching design errors in digital chips

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B. Vermeulen; S.K. Goel
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Published in: IEEE Design & Test of Computers ( Volume: 19, Issue: 3, May-June 2002)
Page(s): 35 - 43
Date of Publication: 07 August 2002

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DOI: 10.1109/MDT.2002.1003792

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