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Journals & Magazines >IEEE Design & Test of Computers >Volume: 19 Issue: 5

Neighborhood selection for I/sub DDQ/ outlier screening at wafer sort

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W.R. Daasch; J. McNames; R. Madge; K. Cota
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Abstract:

To screen defective dies, I/sub DDQ/ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straig...Show More

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Abstract:

To screen defective dies, I/sub DDQ/ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers.
Published in: IEEE Design & Test of Computers ( Volume: 19, Issue: 5, Sept.-Oct. 2002)
Page(s): 74 - 81
Date of Publication: 07 November 2002

ISSN Information:

DOI: 10.1109/MDT.2002.1033795
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