Abstract:
High-resolution ADCs generally require high-end testers to ensure their performances meeting design specifications. This paper presents new test methods that facilitate t...Show MoreMetadata
Abstract:
High-resolution ADCs generally require high-end testers to ensure their performances meeting design specifications. This paper presents new test methods that facilitate to test such devices with low-cost testers.
Published in: IEEE Design & Test ( Volume: 30, Issue: 4, August 2013)