Simulation of the system for metrological examination of digital measuring modules | IEEE Conference Publication | IEEE Xplore

Simulation of the system for metrological examination of digital measuring modules


Abstract:

The paper has considered a model of the system for metrological examination according to the histogram method and its following development - method of “sliding” histogra...Show More

Abstract:

The paper has considered a model of the system for metrological examination according to the histogram method and its following development - method of “sliding” histogram.
Date of Conference: 11-15 June 2017
Date Added to IEEE Xplore: 13 July 2017
ISBN Information:
Conference Location: Bar, Montenegro

References

References is not available for this document.