Abstract:
Self-describing sensors and measurements are a key component to establish (semi-)automated data-analysis in the context of Industry 4.0. In this contribution, multiple po...Show MoreMetadata
Abstract:
Self-describing sensors and measurements are a key component to establish (semi-)automated data-analysis in the context of Industry 4.0. In this contribution, multiple popular ontologies and vocabularies in the field of metrology are evaluated regarding their suitability for an industry-oriented metrological use case. The results are used to map necessary concepts from existing knowledge bases into a coherent new ontology that fulfills metrological requirements of sensor and measurement descriptions. We are considering use cases where aspects of sensor networks, network topology, network robustness, information fusion, calibration models for dynamic uncertainty, correct metrological representation and implementation performance are of interest.
Date of Conference: 03-05 June 2020
Date Added to IEEE Xplore: 10 July 2020
ISBN Information: