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Welcome to IEEE AUTOTESTCON 2018 [President's Message] | IEEE Journals & Magazine | IEEE Xplore

Welcome to IEEE AUTOTESTCON 2018 [President's Message]

Abstract:

Presents the President’s message for this issue of the publication.

Presents the President’s message for this issue of the publication.

Published in: IEEE Instrumentation & Measurement Magazine ( Volume: 21, Issue: 4, August 2018)

Page(s): 3 - 3

Date of Publication: 01 August 2018

DOI: 10.1109/MIM.2018.8423737