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The use and abuse of SPEC: An ISCA panel | IEEE Journals & Magazine | IEEE Xplore
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Journals & Magazines >IEEE Micro >Volume: 23 Issue: 4

The use and abuse of SPEC: An ISCA panel

J. Hennessy; D. Citron; D. Patterson; G. Sohi
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Published in: IEEE Micro ( Volume: 23, Issue: 4, July-Aug. 2003)
Page(s): 73 - 77
Date of Publication: 31 August 2003

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DOI: 10.1109/MM.2003.1225977

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