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An orthogonal wavelet denoising algorithm for surface images of atomic force microscopy | IEEE Conference Publication | IEEE Xplore

An orthogonal wavelet denoising algorithm for surface images of atomic force microscopy


Abstract:

This paper deals with the noise reduction of discrete AFM surface images using orthogonal wavelets. More in detail, it compares the usefulness of the Daubechies wavelets ...Show More

Abstract:

This paper deals with the noise reduction of discrete AFM surface images using orthogonal wavelets. More in detail, it compares the usefulness of the Daubechies wavelets with different vanishing moments for noise reduction. The work is based upon the discrete wavelet transform (DWT) version of wavelet package transform (WPT). With the help of a seminorm the measurement of noise of a sequence is defined. An algorithm for noise reduction is proposed to detect unavoidable measured noise in topographic surface scans. The denoising wavelet algorithm is used to improve the quality of the scanned images. By taking real measurements in which the measurement and system noise is included, the effectiveness of the proposed denoising algorithm is validated.
Date of Conference: 29 August 2016 - 01 September 2016
Date Added to IEEE Xplore: 26 September 2016
ISBN Information:
Conference Location: Miedzyzdroje, Poland

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