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Title: A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.

Abstract

Abstract not provided.

Authors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1141664
Report Number(s):
SAND2014-2449C
506491
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Midwest Symposium on Circuits and Systems held August 3-6, 2014 in College Station, TX.
Country of Publication:
United States
Language:
English

Citation Formats

Lee, David S., and Draper, Jeffrey. A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.. United States: N. p., 2014. Web. doi:10.1109/MWSCAS.2014.6908412.
Lee, David S., & Draper, Jeffrey. A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.. United States. https://doi.org/10.1109/MWSCAS.2014.6908412
Lee, David S., and Draper, Jeffrey. 2014. "A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.". United States. https://doi.org/10.1109/MWSCAS.2014.6908412. https://www.osti.gov/servlets/purl/1141664.
@article{osti_1141664,
title = {A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.},
author = {Lee, David S. and Draper, Jeffrey},
abstractNote = {Abstract not provided.},
doi = {10.1109/MWSCAS.2014.6908412},
url = {https://www.osti.gov/biblio/1141664}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Mar 01 00:00:00 EST 2014},
month = {Sat Mar 01 00:00:00 EST 2014}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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