Simple and Low-Cost Measurement Test Setup to Determine the RF, LO and IF Impedances for Designing GaN FET Resistive Mixer | IEEE Conference Publication | IEEE Xplore

Simple and Low-Cost Measurement Test Setup to Determine the RF, LO and IF Impedances for Designing GaN FET Resistive Mixer


Abstract:

This paper deals with a simple and low-cost test setup capable to measure the impedances needed for designing a FET resistive mixer. The proposed method uses an external ...Show More

Abstract:

This paper deals with a simple and low-cost test setup capable to measure the impedances needed for designing a FET resistive mixer. The proposed method uses an external signal generator along with one port S-parameters measurement and signal flow theory to determine the impedances at the RF, LO and IF frequencies. A packaged GaN FET is used to design a high linearity FET resistive mixer suitable to down-convert a 2.4 GHz LTE signal to a 0.1 GHz IF signal and the experimental results show a conversion loss of 6.9 dB and ACLR better than 45 dBc.
Date of Conference: 04-07 August 2019
Date Added to IEEE Xplore: 31 October 2019
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Conference Location: Dallas, TX, USA

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