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Framework of MEMS high accelerated stress test | IEEE Conference Publication | IEEE Xplore

Framework of MEMS high accelerated stress test


Abstract:

Given the reliability principles and failure mechanism of MEMS, this paper discussed the accelerated test from three aspects as follows: the connotation of the test inclu...Show More

Abstract:

Given the reliability principles and failure mechanism of MEMS, this paper discussed the accelerated test from three aspects as follows: the connotation of the test including concept and meaning; the scope of application concerned with product levels for applicants in types of stress; test process includes the test objective determination, test stressing selection, the test profile designing, the implementation scheme determining, analysis and improvement measures.
Date of Conference: 20-23 January 2010
Date Added to IEEE Xplore: 30 September 2010
ISBN Information:
Conference Location: Xiamen, China

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