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Fabrication and characterization of ultra-thin PIN detector | IEEE Conference Publication | IEEE Xplore

Fabrication and characterization of ultra-thin PIN detector


Abstract:

A novel process for ultra-thin (30~50μm) PIN detector fabrication has been developed. The leakage current of all our PIN detectors is found to be less than 6nA at 10V rev...Show More

Abstract:

A novel process for ultra-thin (30~50μm) PIN detector fabrication has been developed. The leakage current of all our PIN detectors is found to be less than 6nA at 10V reverse bias. Compared with the leakage current before packaging, the I-V characteristics remain unchanged after the detectors are packaged. The active region get fully depleted at −3V bias, while the breakdown voltage is measured to be −664V. Finally, our ultra-thin PIN detector offers an energy resolution about 21.78KeV for 5.486MeV alpha when used in spectroscopy.
Date of Conference: 20-23 January 2010
Date Added to IEEE Xplore: 30 September 2010
ISBN Information:
Conference Location: Xiamen, China

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