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BIST-based delay-fault testing in FPGAs | IEEE Conference Publication | IEEE Xplore

BIST-based delay-fault testing in FPGAs


Abstract:

We present the first delay-fault testing approach for FPGAs, applicable both for manufacturing and for on-line testing. Our approach is based on BIST, is comprehensive, a...Show More

Abstract:

We present the first delay-fault testing approach for FPGAs, applicable both for manufacturing and for on-line testing. Our approach is based on BIST, is comprehensive, and does not require expensive ATE. We have successfully implemented this BIST approach on the ORCA 2C series FPGA.
Date of Conference: 10-10 July 2002
Date Added to IEEE Xplore: 07 November 2002
Print ISBN:0-7695-1641-6
Conference Location: Bendor, France

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