Abstract:
Spatial resolution enhancement of microwave radiometer measurements is addressed using a new method that is based on an Lp penalisation approach with a variable p exponen...Show MoreMetadata
Abstract:
Spatial resolution enhancement of microwave radiometer measurements is addressed using a new method that is based on an Lp penalisation approach with a variable p exponent. The key idea is letting p to vary in the range 1.2 - 2 to take benefit of both Hilbert (i.e. p=2) and Banach (i.e. p=1.2) advantages. Results, obtained processing both simulated and actual Special Sensor Microwave Imager (SSM/I) measurements, demonstrate the benefits of the proposed approach in reconstructing abrupt discontinuities and smooth gradients with respect to approaches in Hilbert and Banach spaces.
Published in: 2019 IEEE 5th International forum on Research and Technology for Society and Industry (RTSI)
Date of Conference: 09-12 September 2019
Date Added to IEEE Xplore: 11 November 2019
ISBN Information: