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N-gram pattern recognition using multivariate-Bernoulli model with smoothing methods for text classification | IEEE Conference Publication | IEEE Xplore

N-gram pattern recognition using multivariate-Bernoulli model with smoothing methods for text classification


Abstract:

In this paper, we mainly study on n-gram models on text classification domain. In order to measure impact of n-gram models on the classification performance, we carry out...Show More

Abstract:

In this paper, we mainly study on n-gram models on text classification domain. In order to measure impact of n-gram models on the classification performance, we carry out Naïve Bayes classifier with various smoothing methods. Naïve Bayes classifier has generally used two main event models for text classification which are Bernoulli and multinomial models. Researchers usually address multinomial model and Laplace smoothing on text classification and similar domains. The objective of this study is to demonstrate the classification performance of event models of Naïve Bayes by analyzing both event models with different smoothing methods and using n-gram models from a different perspective. In order to find various patterns between two event models, we carry on experiments a large Turkish dataset. Experiment results indicate that Bernoulli event model with an appropriate smoothing method can outperform on most of the n-gram models.
Date of Conference: 16-19 May 2016
Date Added to IEEE Xplore: 23 June 2016
ISBN Information:
Conference Location: Zonguldak, Turkey