Abstract:
Memories are among the most dense integrated circuits fabricated, and so, have the highest rate of defects. This paper proposes a scheme for selecting the right redundanc...Show MoreMetadata
Abstract:
Memories are among the most dense integrated circuits fabricated, and so, have the highest rate of defects. This paper proposes a scheme for selecting the right redundancy in memory designs driven by the fabrication cost and the yield. It also proposes a new memory architecture that fills the gap between the existing all-or-none extremes with memories. Experiments show that the new scheme reduces cost by up to 70%.
Published in: 2007 IEEE International SOC Conference
Date of Conference: 26-29 September 2007
Date Added to IEEE Xplore: 20 June 2008
ISBN Information: