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Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime | IEEE Conference Publication | IEEE Xplore

Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime


Abstract:

This paper addresses the problem of detecting the number of signals correlated across multiple data sets with small sample support. While there have been studies involvin...Show More

Abstract:

This paper addresses the problem of detecting the number of signals correlated across multiple data sets with small sample support. While there have been studies involving two data sets, the problem with more than two data sets has been less explored. In this work, a rank-reduced hypothesis test for more than two data sets is presented for scenarios where the number of samples is small compared to the dimensions of the data sets.
Date of Conference: 26-29 June 2016
Date Added to IEEE Xplore: 25 August 2016
ISBN Information:
Conference Location: Palma de Mallorca, Spain

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