Abstract:
The following topics are dealt with: statistical analysis; feature extraction; software reliability; user interfaces; time series; fractals; Bayes methods; Monte Carlo me...Show MoreMetadata
Abstract:
The following topics are dealt with: statistical analysis; feature extraction; software reliability; user interfaces; time series; fractals; Bayes methods; Monte Carlo methods; astrometry; astronomical image processing.
Published in: 2019 IEEE 14th International Conference on Computer Sciences and Information Technologies (CSIT)
Date of Conference: 17-20 September 2019
Date Added to IEEE Xplore: 12 December 2019
ISBN Information:
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